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For Semiconductor Prober Testing,
Optem® Offers the HF Video Microscope
With the trend toward larger wafer probing test heads to
accommodate larger semiconductor wafers, microscope eyepieces are
ascending farther away from the subject wafer. This higher positioning
makes through-eyepiece viewing of the test subject uncomfortable and
impractical.
Our HF Video Microscope System reduces operator fatigue by
side-stepping eyepiece viewing, in favor of more accessible images on a
video monitor.
The HF Video Microscope System mounts directly and easily to your test
head and remains safely in position during manipulation. Contained
within a 54 mm diameter tube, this compact optical system accommodates
any size test head with an aperture greater than 63.5 mm (2.5").
In addition, several mounting kits are available to ensure proper fit with
a wide variety of test head brands and models.
Other features include:
- 7:1 Parfocal Zoom Ratio
eliminates refocusing throughout the continuous zoom range and promotes
easier target acquisition
- Available with motorized X-Y
Scanning, Zoom and Focus are controlled from one controller to streamline
viewing functions and enhance repeatability Adjustable X-Y End-Stops
prevent damage and maladjustment resulting from microscope contact with
the test head walls
- Fixed Mounting Configuration
eliminates microscope manipulation in and out of test head, minimizing
damage and improving subject change-out speed
- Unique Internal Focus ranging
over 10mm for smooth, fast and accurate focus adjustment
- Uniform Oblique (Dark-field)
Illumination throughout the zoom range eliminates back reflections from
wafer increasing accuracy
- True-Color Rendition of chip
with coaxial illumination improves video image and test accuracy
- Quick and Easy System removal
from the tester streamlines periodic service and cleaning
- Theta
Adjustment quickly aligns optical system to wafer minimizing subject
change-out time and increasing repeatability.
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