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Automated
Analytical Microscopes
The A-Zoom2 is a variable power viewing system that represents the next generation of analytical microscopes for use in microelectronics inspection, development, testing and analysis. Designed for the Probing Market where it is necessary to locate and inspect very fine electronic traces using even finer electronic probes. The microscope used in a probe station or as a stand-alone system, routinely resolves feature geometry in the sub-micron range. The A-Zoom2 does this by combining a zoom system (10X or 40X depending on the model) with a series of long working distance objectives for maximum flexibility. Both eyepieces and video viewing are available. An optional second viewing axis (NAVCAM) may be used for continuous low magnification tracking. Our unique laser adapter option offers flexibility for all your micro-machining, layer passivation, circuit repairs, test and R & D needs. The A-Zoom2 is available as an OEM Probe Head (with or without an attached focus mechanism), or as a free standing bench model.
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